Researchers at the Swagelok Center for Surface Analysis of Materials at Case Western Reserve University have collaborated with Princeton University to develop a new technique to analyze organic crystals.
Electron backscatter diffraction is a technique commonly used to examine the crystallographic structure of polished inorganic samples. It can be used to determine grain size, crystal orientation and phase identification of samples. Used in combination with energy dispersive X-Ray spectroscopy, the microstructure of metallic samples can be thoroughly characterized. Using image processing, the fraction of each phase can be measured.
Although this technique is vastly used for the metallic samples, this research opens new avenues for characterization of organic crystal molecules.
The team published two articles on the subject: “Homoepitaxy of Crystalline Rubrene Thin Films” in Nano Letters, and “Use of an Underlayer for Large Area Crystallization of Rubrene Thin Films” in the Journal of Chemistry of Materials.